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Despite their rapid development, there are still ongoing issues related to heterogeneous \u003cbr /\u003elm properties which limit device performance. It has been suggested that sites which capture charge carriers (traps) could be localized on a micrometer or smaller size scale, leading to regions of poor e\u003cbr /\u003eciency. Understanding the electronic properties of such regions, in particular on how they in\u003cbr /\u003euence carrier recombination, will therefore provide crucial information about the carrier loss pathways in HOIP \u003cbr /\u003elms, which will be essential for developing new strategies to minimize losses and create more e\u003cbr /\u003ecient devices. In order to gain information about the ultrafast charge carrier recombination dynamics on nanoscale length scales, specialized techniques which can provide information with both high spatial and temporal resolution will be necessary. Here, we utilize time resolved photoemission electron microscopy (TR-PEEM) as a novel technique to study the nanoscale ultrafast properties of photo excited carriers and their relation to heterogeneous \u003cbr /\u003elm properties in HOIP thin \u003cbr /\u003elm materials. Following this overall theme, the work in this thesis will address several nanoscale properties and phenomenon. First, we will uncover the nanoscale distribution of carrier traps in a HOIP \u003cbr /\u003elm which result in non-radiative losses. We then will describe in depth the ultrafast carrier trapping processes happening at nanoscale trap clusters. Following this, we will then discuss other novel information and studies on the traps in HOIP which can be realized using TR-PEEM, namely on e\u001bects of light treatments and morphological information. 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有機無機ハイブリッドペロブスカイトの空間的と時間的にトラップ顕微鏡
https://doi.org/10.15102/1394.00001604
https://doi.org/10.15102/1394.00001604132a948a-e749-45a2-a93b-c1368d02e2c3
名前 / ファイル | ライセンス | アクション |
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Full Text (11.8 MB)
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Final Exam Abstract (42.9 kB)
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||||
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公開日 | 2020-11-05 | |||||||
タイトル | ||||||||
言語 | ja | |||||||
タイトル | 有機無機ハイブリッドペロブスカイトの空間的と時間的にトラップ顕微鏡 | |||||||
タイトル | ||||||||
言語 | en | |||||||
タイトル | Spatially and temporally resolved microscopy of traps in hybrid organic-inorganic perovskites | |||||||
言語 | ||||||||
言語 | eng | |||||||
資源タイプ | ||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_db06 | |||||||
資源タイプ | doctoral thesis | |||||||
ID登録 | ||||||||
ID登録 | 10.15102/1394.00001604 | |||||||
ID登録タイプ | JaLC | |||||||
アクセス権 | ||||||||
アクセス権 | open access | |||||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||||
著者 (英) |
Winchester, Andrew
× Winchester, Andrew
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抄録 | ||||||||
内容記述タイプ | Other | |||||||
内容記述 | In recent years the class of materials known as hybrid organic-inorganic perovskite (HOIP) have received notable attention for use in photovoltaic applications, with record solar conversion e<br />ciencies reaching other established thin <br />lm systems. Despite their rapid development, there are still ongoing issues related to heterogeneous <br />lm properties which limit device performance. It has been suggested that sites which capture charge carriers (traps) could be localized on a micrometer or smaller size scale, leading to regions of poor e<br />ciency. Understanding the electronic properties of such regions, in particular on how they in<br />uence carrier recombination, will therefore provide crucial information about the carrier loss pathways in HOIP <br />lms, which will be essential for developing new strategies to minimize losses and create more e<br />cient devices. In order to gain information about the ultrafast charge carrier recombination dynamics on nanoscale length scales, specialized techniques which can provide information with both high spatial and temporal resolution will be necessary. Here, we utilize time resolved photoemission electron microscopy (TR-PEEM) as a novel technique to study the nanoscale ultrafast properties of photo excited carriers and their relation to heterogeneous <br />lm properties in HOIP thin <br />lm materials. Following this overall theme, the work in this thesis will address several nanoscale properties and phenomenon. First, we will uncover the nanoscale distribution of carrier traps in a HOIP <br />lm which result in non-radiative losses. We then will describe in depth the ultrafast carrier trapping processes happening at nanoscale trap clusters. Following this, we will then discuss other novel information and studies on the traps in HOIP which can be realized using TR-PEEM, namely on eects of light treatments and morphological information. By gaining a deeper understanding in these directions, we hope to contribute to the broader goal of improving HOIP photovoltaic device e<br />ciency and showcase TR-PEEM as a novel technique for studying photocarrier dynamics in semiconductor materials. | |||||||
言語 | en | |||||||
口頭試問日 | ||||||||
2020-09-11 | ||||||||
学位授与年月日 | ||||||||
学位授与年月日 | 2020-10-31 | |||||||
学位名 | ||||||||
学位名 | Doctor of Philosophy | |||||||
学位授与番号 | ||||||||
学位授与番号 | 甲第62号 | |||||||
学位授与機関 | ||||||||
学位授与機関識別子Scheme | kakenhi | |||||||
学位授与機関識別子 | 38005 | |||||||
学位授与機関名 | Okinawa Institute of Science and Technology Graduate University | |||||||
著者版フラグ | ||||||||
出版タイプ | VoR | |||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||
権利 | ||||||||
権利情報 | © 2020 The Author. |