@article{oai:oist.repo.nii.ac.jp:00002101,
 author = {Awaki, Hisamitsu and Maeda, Yoshitomo and Matsumoto, Hironori and Svendsen, Sara and Bavdaz, Marcos and Collon, Maximilien and Asakura, Kazunori and Christensen, Finn E. and Ferreira, Desiree D. M. and Guainazzi, Matteo and Hoshino, Masato and Ide, Shuntaro and Ishibashi, Kazunori and Kan, Wansu and Massahi, Sonny and Miyazawa, Takuya and Shimizu, Sadayuki and Shortt, Brian and Takehara, Yusuke and Tamura, Keisuke and Uesugi, Kentaro and Willingale, Richard and Yoneyama, Tomokage and Yoshida, Atsushi},
 issue = {1},
 journal = {Journal of Astronomical Telescopes, Instruments, and Systems},
 month = {Jan},
 note = {Athena, a future high-energy mission, is expected to consist of a large aperture x-ray mirror with a focal length of 12 m. The mirror surface is to be coated with iridium and a low Z overcoat. To define the effective area of the x-ray telescope, the atomic scattering factors of iridium with an energy resolution less than that (2.5 eV) of the x-ray integral field unit are needed. We measured the reflectance of the silicon pore optics mirror plate coated with iridium in the energy range of 9 to 15 keV and that near the iridium L-edges in steps of 10 and 1.5 eV, respectively, at the synchrotron beamline SPring-8. The L3, L2, and L1 edges were clearly detected around 11,215, 12,824, and 13,428 eV, respectively. The measured scattering factors were ∼3  %   smaller than the corresponding values reported by Henke et al., likely due to the presence of an overlayer on the iridium coating, and were consistent with those measured by Graessle et al. The angular dependence of the reflectivity measured indicates that the iridium surface was extremely smooth, with a surface roughness of 0.3 nm.},
 title = {Measuring the atomic scattering factors near the iridium L-edges for the Athena silicon pore optics reflector},
 volume = {7},
 year = {2021}
}