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{"_buckets": {"deposit": "27f20c4b-da49-4f1a-b803-1ac527352b13"}, "_deposit": {"created_by": 26, "id": "249", "owners": [26], "pid": {"revision_id": 0, "type": "depid", "value": "249"}, "status": "published"}, "_oai": {"id": "oai:oist.repo.nii.ac.jp:00000249", "sets": ["55"]}, "author_link": ["761", "759", "760"], "item_10001_biblio_info_7": {"attribute_name": "Bibliographic Information", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2017-04-19", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "16 ", "bibliographicPageStart": "163503", "bibliographicVolumeNumber": "110", "bibliographic_titles": [{}, {"bibliographic_title": "Applied Physics Letters", "bibliographic_titleLang": "en"}]}]}, "item_10001_creator_3": {"attribute_name": "Author", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Cassidy, C."}], "nameIdentifiers": [{"nameIdentifier": "759", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Dhar, A."}], "nameIdentifiers": [{"nameIdentifier": "760", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Shintake, T."}], "nameIdentifiers": [{"nameIdentifier": "761", "nameIdentifierScheme": "WEKO"}]}]}, "item_10001_description_5": {"attribute_name": "Abstract", "attribute_value_mlt": [{"subitem_description": "Mean inner potential is a fundamental material parameter in solid state physics and electron microscopy and has been experimentally measured in CdTe, a technologically important semiconductor. As a first step, the inelastic mean free path for electron scattering in CdTe was determined, using electron energy loss spectroscopy, to enable precise thickness mapping of thin CdTe lamellae. The obtained value was λi(CdTe, 300 kV) = 192 ± 10 nm. This value is relatively large, given the high density of the material, and is discussed in the text. Next, electron diffraction and specimen tilting were employed to identify weakly diffracting lattice orientations, to enable the straightforward measurement of the electron phase shift. Finally, electron holography was utilized to quantitatively map the phase shift experienced by electron waves passing through a CdTe crystal, with several different propagation vectors. Utilization of both thickness and phase data allowed computation of mean inner potential as V0 (CdTe) = 14.0 ± 0.9 V, within the range of previous theoretical estimates.", "subitem_description_type": "Other"}]}, "item_10001_publisher_8": {"attribute_name": "Publisher", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics"}]}, "item_10001_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1063/1.4981809", "subitem_relation_type_select": "DOI"}}]}, "item_10001_relation_17": {"attribute_name": "Related site", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://aip.scitation.org/doi/full/10.1063/1.4981809", "subitem_relation_type_select": "URI"}}]}, "item_10001_rights_15": {"attribute_name": "Rights", "attribute_value_mlt": [{"subitem_rights": "© 2017 Author(s)"}]}, "item_10001_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0003-6951", "subitem_source_identifier_type": "ISSN"}, {"subitem_source_identifier": "1077-3118", "subitem_source_identifier_type": "ISSN"}]}, "item_10001_version_type_20": {"attribute_name": "Author\u0027s flag", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-04-21"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "1.4981809.pdf", "filesize": [{"value": "6.4 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensefree": "Creative Commons Attribution 4.0 International \n(http://creativecommons.org/licenses/by/4.0/)", "licensetype": "license_free", "mimetype": "application/pdf", "size": 6400000.0, "url": {"label": "1.4981809", "url": "https://oist.repo.nii.ac.jp/record/249/files/1.4981809.pdf"}, "version_id": "d87654c3-c33c-48cb-9e2a-f5063d47d16a"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Determination of the mean inner potential of cadmium telluride via electron holography", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Determination of the mean inner potential of cadmium telluride via electron holography", "subitem_title_language": "en"}]}, "item_type_id": "10001", "owner": "26", "path": ["55"], "permalink_uri": "https://oist.repo.nii.ac.jp/records/249", "pubdate": {"attribute_name": "公開日", "attribute_value": "2018-01-19"}, "publish_date": "2018-01-19", "publish_status": "0", "recid": "249", "relation": {}, "relation_version_is_last": true, "title": ["Determination of the mean inner potential of cadmium telluride via electron holography"], "weko_shared_id": 26}
Determination of the mean inner potential of cadmium telluride via electron holography
https://oist.repo.nii.ac.jp/records/249
https://oist.repo.nii.ac.jp/records/249a6e3a9a5-a65f-4464-b8ba-36fc9ba1aae3
名前 / ファイル | ライセンス | アクション |
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1.4981809 (6.4 MB)
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Creative Commons Attribution 4.0 International
(http://creativecommons.org/licenses/by/4.0/) |
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2018-01-19 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Determination of the mean inner potential of cadmium telluride via electron holography | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者(英) |
Cassidy, C.
× Cassidy, C.× Dhar, A.× Shintake, T. |
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書誌情報 |
en : Applied Physics Letters 巻 110, 号 16, p. 163503, 発行日 2017-04-19 |
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抄録 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Mean inner potential is a fundamental material parameter in solid state physics and electron microscopy and has been experimentally measured in CdTe, a technologically important semiconductor. As a first step, the inelastic mean free path for electron scattering in CdTe was determined, using electron energy loss spectroscopy, to enable precise thickness mapping of thin CdTe lamellae. The obtained value was λi(CdTe, 300 kV) = 192 ± 10 nm. This value is relatively large, given the high density of the material, and is discussed in the text. Next, electron diffraction and specimen tilting were employed to identify weakly diffracting lattice orientations, to enable the straightforward measurement of the electron phase shift. Finally, electron holography was utilized to quantitatively map the phase shift experienced by electron waves passing through a CdTe crystal, with several different propagation vectors. Utilization of both thickness and phase data allowed computation of mean inner potential as V0 (CdTe) = 14.0 ± 0.9 V, within the range of previous theoretical estimates. | |||||
出版者 | ||||||
出版者 | American Institute of Physics | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0003-6951 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1077-3118 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1063/1.4981809 | |||||
権利 | ||||||
権利情報 | © 2017 Author(s) | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://aip.scitation.org/doi/full/10.1063/1.4981809 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |