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Boundary curvature effect on the wrinkling of thin suspended films
https://oist.repo.nii.ac.jp/records/1518
https://oist.repo.nii.ac.jp/records/151871200430-885e-4c2a-b40a-94b534704abe
| 名前 / ファイル | ライセンス | アクション |
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Janssens-2020-Boundary curvature effect on the (1.8 MB)
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Creative Commons Attribution 4.0 International(https://creativecommons.org/licenses/by/4.0/)
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201101_1 (214.6 kB)
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Creative Commons Attribution-NonCommercial 4.0 International(https://creativecommons.org/licenses/by-nc/4.0/)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-05-20 | |||||
| タイトル | ||||||
| タイトル | Boundary curvature effect on the wrinkling of thin suspended films | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 著者（英） |
Janssens, Stoffel D.
× Janssens, Stoffel D.× Sutisna, Burhannudin× Giussani, Alessandro× Kwiecinski, James A.× Vázquez-Cortés, David× Fried, Eliot |
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| 書誌情報 |
en : Applied Physics Letters 巻 116, 号 19, p. 193702, 発行日 2020-05-11 |
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| 抄録 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | A relation between the boundary curvature κ and the wrinkle wavelength λ of a thin suspended film under boundary confinement is demonstrated. Experiments were performed with nanocrystalline diamond films of approximate thickness 184nm grown on glass substrates. By removing portions of the substrates after growth, suspended films with circular boundaries of radius 30–811 μm were fabricated. Due to residual stresses, the portions of the film bonded to the substrate are of approximate compressive prestrain 11×10⁻⁴ and the suspended portions of the film are azimuthally wrinkled at their boundary. Measurements show that λ decreases monotonically with κ, and a simple model that is in line with this trend is proposed. The model can be applied to design devices with functional wrinkles and can be adapted to gain insight into other systems such as plant leaves. A method for measuring residual compressive strain in thin films, which complements standard strain characterization methods, is also described. | |||||
| 出版者 | ||||||
| 出版者 | AIP Publishing | |||||
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| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0003-6951 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1077-3118 | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | info:doi/10.1063/5.0006164 | |||||
| 権利 | ||||||
| 権利情報 | © 2020 Author(s). | |||||
| 情報源 | ||||||
| 関連名称 | https://creativecommons.org/licenses/by/4.0/ | |||||
| 情報源 | ||||||
| 関連名称 | https://creativecommons.org/licenses/by-nc/4.0/ | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://aip.scitation.org/doi/10.1063/5.0006164 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://aip.scitation.org/doi/10.1063/10.0001268 | |||||
| 関連名称 | Scilight | |||||
| 著者版フラグ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
